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芯片开封视觉激光打标机
芯片开封视觉激光打标机
芯片开封即Decap，又称为开盖和开帽，指的是对完整保证的IC芯片进行局部的腐蚀，使得IC芯片能够暴露出来，同时还能够保证芯片的各项功能没有受损，为后续的芯片故障分析实验做准备，便于观察和进行其他测试。通过芯片开封，我们可以更为直观地观察到芯片内部结构，从而结构OM等设备分析判断样品的故障原因和失效的可能原因。
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